A dedicated and versatile system for testing the radiation hardness of various integrated circuits

Abstract This work describes the architecture of a versatile system that is dedicated to testing various integrated circuits in radiation (e.g., ASICs, FPGAs). The powers device under test remotely. It monitors and reads out real time parameters, like: power consumption, voltage current (with resolution 100 µV µA, respectively), specific operational parameters its package temperature. A key feature this multi-channel remote supply capabilities, used test. embeds built-in features detect record single-event latch-ups, single event upsets monitor total ionizing dose cumulative effects. graphical user interface allows connect control entire through ethernet from safe location zone, disk measurements data.